Public tender
The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
Danmarks Tekniske Universitet - DTU
Details
- Submission deadline
- 16. Nov. 2026
- Country
- Estimated value
- On request
- CPV codes
- 385111003851100038512100
Documents
- Leistungsverzeichnis
- Preisblatt
- Bewerbungsbedingungen
- Vertragsbedingungen
- Anlagen und Pläne
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